Call Number (LC) | Title | Results |
---|---|---|
C 13.10:260-116 |
Standard reference materials : glass filters as a standard reference material for spectrophotometry - selection, preparation, certification, and use of SRM 930 and SRM 1930 / Glass filters as a standard reference material for spectrophotometry selection, preparation, certification, and use of SRM 930 and SRM 1930 / |
2 |
C 13.10:260-117 |
Standard reference materials : antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems / Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems |
2 |
C 13.10:260-118 |
Standard reference materials : calibration of NIST standard reference material 3202 for 18-track, parallel, and 36-track, parallel serpentine, 12.65 mm (0.5 in), 1491 cpmm (37871 cpi), magnetic tape cartridge / Standard reference materials. |
2 |
C 13.10:260-119 |
Standard reference materials : antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems / Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems standard reference materials / |
2 |
C 13.10:260-120 |
A users' guide to NIST SRM 2084 CMM probe performance standard / Standard reference materials : a users' guide to NIST SRM 2084 / |
2 |
C 13.10:260-121 |
Standard reference materials : certification of a standard reference material for the determination of interstitial oxygen concentration in semiconductor silicon by infrared spectrophotometry / Certification of a standard reference material for the determination of interstitial oxygen concentration in semiconductor silicon by infrared spectrophotometry |
2 |
C 13.10:260-122 |
Standard reference materials : polystyrene films for calibrating the wavelength scale of infrared spectrophotometers - SRM 1921 / Polystyrene films for calibrating the wavelength scale of infrared spectrophotometers - SRM 1921 |
2 |
C 13.10:260-123 |
Standard reference materials : infrared transmittance standards - SRMs 2053, 2054, 2055, and 2056 / Infrared transmittance standards SRMs 2053, 2054, 2055, and 2056 / |
2 |
C 13.10:260-124 |
Standard reference materials : standard reference material 1744 / Standard reference material 1744 aluminum freezing-point standard / |
2 |
C 13.10:260-125 |
Standard reference materials : statistical aspects of the certification of chemical batch SRMs / Statistical aspects of the certification of chemical batch SRMs |
2 |
C 13.10:260-126 | Standard reference materials : the NIST traceable reference material program for gas standards / | 1 |
C 13.10:260-127 | Standard reference materials : standard reference material 1747 / | 1 |
C 13.10:260-128 |
Standard reference materials : transmission filters with measured optical density at 1064 nm wavelength - SRMs 2046, 2047, 2048, 2049, 2050, and 2051 / Transmission filters with measured optical density at 1064 nm wavelength SRMs 2046, 2047, 2048, 2049, 2050, and 2051 / |
2 |
C 13.10:260-129 |
Standard reference materials : antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems / Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems |
2 |
C 13.10:260-130 |
Standard reference materials : glass fiberboard SRM 1450c, for thermal resistance from 280 K to 340 K / Glass fiberboard, SRM 1450c, for thermal resistance from 280 K to 340 K |
2 |
C 13.10:260-131 | The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements | 1 |
C 13.10:260-132 |
Standard reference materials : indium freezing-point standard - SRM 1745, Indium DCS melting-point standard - SRM 2232 / Indium freezing-point standard--SRM 1745 indium DSC melting-point standard--SRM 2232 / |
2 |
C 13.10:260-133 |
Standard reference materials : acetylene 12C2H2 absorption reference for 1510-1540 nm wavelength calibration - SRM 2517 / Acetylene ¹²C₂H₂ absorption reference for 1510 to 1540nm wavelength calibration--SRM 2517 |
2 |
C 13.10:260-133/2001 | Acetylene ¹²C₂H₂ absorption reference for 1510 nm to 1540 | 1 |
C 13.10:260-134 | Standard reference materials : standard reference material 1749 / | 1 |