Call Number (LC) Title Results
C 13.10:400-61 Metrology for submicrometer devices and circuits / 1
C 13.10:400-62 Method to determine the quality of sapphire / 1
C 13.10:400-63 A FORTRAN program for calculating the electrical parameters of extrinsic silicon / 2
C 13.10:400-64 The Relationship between resistivity and dopant density for phosphorus- and boron-doped silicon / 1
C 13.10:400-65 Test patterns NBS-28 and NBS-28A : random fault interconnect step coverage and other structures / 1
C 13.10:400-66 The design, testing, and analysis of a comprehensive test pattern for measuring CMOS/SOS process performance and control / 2
C 13.10:400-67 The capabilities and limitations of auger sputter profiling for studies of semiconductors /
The capabilities and limitations of auger sputer profiling for studies of semiconductors / 		2
C 13.10:400-68 A manual wafer probe station for an integrated circuit test system / 1
C 13.10:400-69 ARPA/NBS Workshop V, moisture measurement technology for hermetic semiconductor devices : proceedings of the ARPA/NBS Workshop V, held at the National Bureau of Standards, Gaithersburg, MD, March 22-23, 1978 /
ARPA/NBS Workshop V / 		2
C 13.10:400-70 The use of acoustic emission to determine the integrity of large kovar glass-sealed microelectronic packages /
The use of acoustic emission to determine the integrity of large kovar glass-sealed microelectronic packages 		2
C 13.10:400-71 Differential capacitance-voltage profiling of Schottky barrier diodes for measuring implanted depth distributions in silicon / 1
C 13.10:400-72 NBS/RADC workshop, moisture measurement technology for hermetic semiconductor devices, II proceedings of the NBS/RADC workshop held at the National Bureau of Standards, Gaithersburg, MD, November 5-7, 1980 /
NBS/RADC workshop moisture measurement technology for hermetic semiconductor devices II / 		2
C 13.10:400-73 Graphical solution for the helium leak detector and radioisotope methods of hermetic test /
Graphical solution for the helium leak detector and radioisotope methods of hermetic test master graphs and instructions / 		2
C 13.10:400-74 Interlaboratory study on linewidth measurements for antireflective chromium photomasks /
Interlaboratory study on linewidth measurements for antireflective chromium photomasks 		2
C 13.10:400-75 A FORTRAN program for analysis of data from microelectronic test structures /
A FORTRAN program for analysis of data from microelectronic test structures 		2
C 13.10:400-76 TXYZ a program for semiconductor IC thermal analysis /
TXYZ, a program for semiconductor IC thermal analysis 		2
C 13.10:400-77 MOS1 a program for two-dimensional analysis of Si MOSFETs / 2
C 13.10:400-78 Analytic analysis of ellipsometric errors /
Analytic analysis of ellipsometric errors 		2
C 13.10:400-79 Results of the Monte Carlo calculation of one- and two-dimensional distributions of particles and damage /
Results of the Monte Carlo calculation of one- and two-dimensional distributions of particles and damage ion implanted dopants in silicon / 		2
C 13.10:400-80 Silicon-on-insulator /
Silicon-on-insulator a categorized bibliography including abstracts / 		2