Call Number (LC) Title Results
C 13.10:400-81 Automatic determination of the interstitial oxygen content of silicon wafers polished on both sides / 2
C 13.10:400-82 Database for and statistical analysisof the interlaboratory determination of the conversion coefficient for the measurement of the interstitial oxygen content of silicon by infrared absorption /
Database for and statistical analysis of the interlaboratory determination of the conversion coefficient for the measurement of the interstitial oxygen content of silicon by infrared absorption /
Database for and statistical analysis of the interlaboratory determination of the conversion coefficient for the measurement of the interstitial oxygen content of silicon by infrared absorption 		3
C 13.10:400-83 A software program for aiding the analysis of ellipsometric measurements, simple methods /
A software program for aiding the analysis of ellipsometric measurements, simple models 		2
C 13.10:400-84 A software program for aiding the analysis of ellipsometric measurements, simple spectroscopic models / 2
C 13.10:400-85 EPROP : an interactive FORTRAN program for computing selected electronic properties of gallium arsenide and silicon /
EPROP, an interactive FORTRAN program for computing selected electronic properties of gallium arsenide and silicon / 		2
C 13.10:400-86 Thermal resistance measurements /
Thermal resistance measurements 		2
C 13.10:400-87 A programmable reverse-bias safe operating area transistor tester
A programmable reverse-bias safe operating area transistor testor / 		2
C 13.10:400-88 INSTANT-IGBT network simulation and transient ANalysis tool
INSTANT - IGBT network simulation and transient Analysis tool / 		2
C 13.10:400-89 Version 2.0 of the TXYZ thermal analysis program, TXYZ20
Version 2.0 of the TXYZ thermal analysis program / 		2
C 13.10:400-90 Evaluating a chip, wafer, or lot using SUXES, SPICE, and STAT2 /
Evaluating a chip, wafer, or lot using SUXES, SPICE, and STAT2 		2
C 13.10:400-91 A collection of computer programs for two-probe resistance (spreading resistance) and four-probe resistance calculations, RESPAC / 1
C 13.10:400-92 Semiconductor measurement technology evolution of silicon materials characterization : lessons learned for improved manufacturing /
Evolution of silicon materials characterization / 		2
C 13.10:400-93 Design and testing guides for the CMOS and lateral bipolar-on-SOI test library /
Design and testing guides for the CMOS and lateral bipolar-on-SOI test library 		2
C 13.10:400-94 Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites /
Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites 		2
C 13.10:400-95 User's manual for the program MONSEL-1 /
User's manual for the program MONSEL-1 Monte Carlo simulation of SEM signals for linewidth metrology / 		2
C 13.10:400-96 HOTPAC /
HOTPAC programs for thermal analysis including version 3.0 of the TXYZ program, TXYZ 30, and the thermal multilayer program, TML / 		2
C 13.10:400-97 Test structure implementation document /
Test structure implementation document DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) / 		2
C 13.10:400-98 Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry /
Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry 		2
C 13.10:400-99 Semiconductor measurement technology : the results of an interlaboratory study of ellipsometric measurements of thin film silicon dioxide on silicon /
The results of an interlaboratory study of ellipsometric measurements of thin film silicon dioxide on silicon 		2
C 13.10:400-100 Thin film reference materials development /
Thin film reference materials development final report for CRADA CN-1364 / 		2