Call Number (LC) Title Results
C 13.10:400-91 A collection of computer programs for two-probe resistance (spreading resistance) and four-probe resistance calculations, RESPAC / 1
C 13.10:400-92 Evolution of silicon materials characterization /
Semiconductor measurement technology evolution of silicon materials characterization : lessons learned for improved manufacturing / 		2
C 13.10:400-93 Design and testing guides for the CMOS and lateral bipolar-on-SOI test library /
Design and testing guides for the CMOS and lateral bipolar-on-SOI test library 		2
C 13.10:400-94 Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites /
Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites 		2
C 13.10:400-95 User's manual for the program MONSEL-1 /
User's manual for the program MONSEL-1 Monte Carlo simulation of SEM signals for linewidth metrology / 		2
C 13.10:400-96 HOTPAC /
HOTPAC programs for thermal analysis including version 3.0 of the TXYZ program, TXYZ 30, and the thermal multilayer program, TML / 		2
C 13.10:400-97 Test structure implementation document /
Test structure implementation document DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) / 		2
C 13.10:400-98 Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry /
Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry 		2
C 13.10:400-99 Semiconductor measurement technology : the results of an interlaboratory study of ellipsometric measurements of thin film silicon dioxide on silicon /
The results of an interlaboratory study of ellipsometric measurements of thin film silicon dioxide on silicon 		2
C 13.10:400-100 Thin film reference materials development /
Thin film reference materials development final report for CRADA CN-1364 / 		2
C 13.10:400-101 Workshop on mass flow measurement and control for the semiconductor industry /
Workshop on Mass Flow Measurement and Control for the Semiconductor Industry 		2
C 13.10:401 Computer performance evaluation /
Computer performance evaluation : proceedings of the 8th meeting of Computer Performance Evaluation Users Group (CPEUG) / 		2
C 13.10:403 Energy conservation through effective energy utilization : [proceedings of 1973 Engineering Foundation Conference] / 1
C 13.10:404 Approaches to privacy and security in computer systems : proceedings of a conference held at the National Bureau of Standards, March 4-5, 1974. / 1
C 13.10:405 Benchmarking and workload definition : a selected bibliography with abstracts / 1
C 13.10:406 Computer performance evaluation : report of the 1973 NBS/ACM workshop / 1
C 13.10:407 Report of the 59th national conference on weights and measures 1974 / 1
C 13.10:408 Standard reference materials and meaningful measurements : proceedings of the 6th Materials Research Symposium / 1
C 13.10:409 Marine pollution monitoring (petroleum) : proceedings of a symposium and workshop held at the National Bureau of Standards, Gaithersburg, Md., May 13-17, 1974 / 1
C 13.10:410 NBS Metric kit /
NBS metric kit : official metric information. 		2