Call Number (LC) Title Results
C 13.46:431 Second breakdown in semiconductor devices : a bibliography / 1
C 13.46:432 Connection tables from Wiswesser chemical structure notations : a partial algorithm / 1
C 13.46:433 Input /
Input/output packages for the systems 360 assembly language processor / 		2
C 13.46:434 Life cycling test on several strain gage pressure transducers /
"Life cycling" test on several strain gage pressure transducers / 		2
C 13.46:435 The hyperbolic character of certain experimental results which tend toward limiting values / 1
C 13.46:436 Studies of calibration procedures for load cells and proving rings as weighing devices / 1
C 13.46:437 Disclosures on : an automatic collating and sorting machine, optical heterodyne refractometer, liquid metering pump, stable wide-band relaxation oscillator using three inverting amplifiers, and seat belt webbing abrasion resistance testing machin /
Disclosures on : Autosort - an automatic collating and sorting machine, optical heterodyne refractometer, liquid metering pump, stable wide-band relaxation oscillator using three inverting amplifiers, and seat belt webbing abrasion resistance testing machine / 		2
C 13.46:438 Compendium of ab initio calculations of molecular energies and properties / 1
C 13.46:439 Laser-source integrating sphere reflectometer. 1
C 13.46:439/ERRATA Laser-source integrating sphere reflectometer. 1
C 13.46:440 Disclosures on : autoeditor - a semi-automatic copy-editing apparatus /
Disclosures on : Autoeditor - a semi-automatic copy-editing apparatus / 		2
C 13.46:440-449 An empirical formula of the coherent scattering cross section of gamma rays / 1
C 13.46:441 Tabulation of published data on Soviet electron devices through October 1967 / 3
C 13.46:442 An empirical formula of the coherent scattering cross section of gamma rays / 1
C 13.46:443 A computer oriented single-fingerprint identification system / 1
C 13.46:444 Reform : a general-purpose program for manipulating formatted data files / 2
C 13.46:445 A bibliography on methods for the measurement of inhomogeneities in semiconductors, 1953-1967 / 1
C 13.46:446 PRECISE : a multiple precision version of Omnitab / 1
C 13.46:447 Research on high temperature materials at the National Bureau of Standards / 1
C 13.46:448 Status report : National Standard Reference Data System, April 1968 / 2