E 1.99: 0000035066-000
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Time resolved ion beam induced charge collection |
1 |
E 1.99: 0000035076-000
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Geographic resolution issues in RAM transportation risk analysis |
1 |
E 1.99: 0000035094-000
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Characterization of Si nanostructures using internal quantum efficiency measurements |
1 |
E 1.99: 0000035109-000
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Adhesion hysteresis of silane coated microcantilevers |
1 |
E 1.99: 0000035111-000
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The impact of solution agglomeration on the deposition of self-assembled monolayers |
1 |
E 1.99: 0000035112-000
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Catalytic photooxidation of pentachlorophenol using semiconductor nanoclusters |
1 |
E 1.99: 0000035113-000
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The equilibrium state of hydrogen in gallium nitride Theory and experiment. |
1 |
E 1.99: 0000035114-000
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Scaling and optimization of the radiation temperature in dynamic hohlraums |
1 |
E 1.99: 0000035115-000
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Bonding and hardness in nonhydrogenated carbon films with moderate sp(3) content |
1 |
E 1.99: 0000035158-000
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Insentropic compression of solid using pulsed magnetic loading |
1 |
E 1.99: 0000035159-000
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Single transverse mode selectively oxidized vertical cavity lasers |
1 |
E 1.99: 0000035160-000
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Effective index model predicts modal frequencies of vertical-cavity lasers |
1 |
E 1.99: 0000035161-000
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Wavelength dependent measurements of optical fiber transit time, material dispersion, and attenuation |
1 |
E 1.99: 0000035174-000
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Heterogeneity, permeability patterns, and permeability upscaling Physical characterization of a block of Massillon sandstone exhibiting nested scales of heterogeneity. |
1 |
E 1.99: 0000035192-000
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Grating light reflection spectroelectrochemistry for detection of trace amounts of aromatic hydrocarbons in water |
1 |
E 1.99: 0000035204-000
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Mechanical properties and shear failure surfaces of two alumina powders in triaxial compression |
1 |
E 1.99: 0000035206-000
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Effect of morphology of hydrophobic surfaces on cavitation kinetics |
1 |
E 1.99: 0000035207-000
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Algebraic mesh quality metrics |
1 |
E 1.99: 0000035208-000
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Demonstration of highly efficient waveguiding in a photonic crystal slab at x=1.5{micro}m wavelengths |
1 |
E 1.99: 0000035209-000
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Real-space and energy representations for the interface roughness scattering in quantum-well structures |
1 |