E 1.99:CONF-9608106--21
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Ratepayer-funded energy-efficiency programs in a restructured electricity industry Issues, options, and unanswered questions. |
1 |
E 1.99:CONF-9608106--22
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Energy effectiveness of duct sealing and insulation in two multifamily buildings |
1 |
E 1.99:CONF-9608106--23
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Measuring savings in energy savings performance contracts using in-place energy management systems -- A case study |
1 |
E 1.99:CONF-9608107--
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Systematic error revisited |
1 |
E 1.99:CONF-9608107--1
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Using tolerance bounds in scientific investigations |
1 |
E 1.99: conf-9608107--2
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An application of robust parameter design using an alternative to Taguchi methods |
1 |
E 1.99:CONF-9608108--1
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Corroded spent nuclear fuel examined with EELS |
1 |
E 1.99:CONF-9608108--2
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SEM/EDS analysis of boron in waste glasses with ultrathin window detector and digital pulse processor |
1 |
E 1.99:CONF-9608108--3
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Chemical effects of lanthanides and actinides in glasses determined with electron energy loss spectroscopy |
1 |
E 1.99: conf-9608109--1
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Temperature studies in the new Sandia length and mass primary standards labs |
1 |
E 1.99:CONF-9608109--2
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Oak Ridge callibration recall program |
1 |
E 1.99: conf-9608110--1
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Humic and fluvic acids and organic colloidal materials in the environment |
1 |
E 1.99:CONF-9608112--1
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Penta-prism long trace profiler (PPLTP) for measurement of grazing incidence space optics |
1 |
E 1.99: conf-9608113--2
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The explosive components facility - fulfilling its role as a national resource |
1 |
E 1.99:CONF-9608113--3
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Proof testing of an explosion containment vessel |
1 |
E 1.99: conf-9608114--1
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Addressing uncertainty in rock properties through geostatistical simulation |
1 |
E 1.99: conf-9608115--1
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Insights into multivariate calibration using errors-in-variables modeling |
1 |
E 1.99: conf-9608116--1
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Effect of oxidations on phosphorus-diffused crystalline-silicon substrates |
1 |
E 1.99:CONF-9608116--2
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Self-aligned selective emitter plasma-etchback and passivation process for screen-printed silicon solar cells |
1 |
E 1.99:CONF-9608116--Summ
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Sixth workshop on the role of impurities and defects in silicon device processing |
1 |