Call Number (LC) Title Results
TA417.23 .A655 2006eb Applied scanning probe methods II scanning probe microscopy techniques / 1
TA417.23 .A655 2007eb Applied scanning probe methods V : scanning probe microscopy techniques /
Applied scanning probe methods VII : biomimetics and industrial applications / 		2
TA417.23 .A655 2008 Applied scanning probe methods X : biomimetics and industrial applications / 1
TA417.23 .A655 2008b Applied scanning probe methods IX : characterization / 2
TA417.23 .A655 2008eb Applied scanning probe methods X biomimetics and industrial applications / 1
TA417.23 .A655 2009b Applied scanning probe methods XII characterization / 1
TA417.23 .A6552 2006 Applied scanning probe methods II : scanning probe microscopy techniques / 1
TA417.23 .A6553 2006 Applied scanning probe methods III : characterization / 1
TA417.23 .A6554 2005eb Applied scanning probe methods III characterisation / 1
TA417.23 .A6554 2006 Applied scanning probe methods IV : industrial applications / 1
TA417.23 .A6554 2006eb Applied scanning probe methods IV industrial applications. 1
TA417.23 .A659 2007 Applied scanning probe methods. 1
TA417.23 .A6592 2007 Applied scanning probe methods. 1
TA417.23 .A6593 2007 Applied scanning probe methods. 1
TA417.23 .A66 1991 Applied spectroscopy in material science 21-23 January 1991, Los Angeles, California / 1
TA417.23 .A86 1997 Atomic resolution microscopy of surfaces and interfaces : symposium held December 3-5, 1996, Boston, Massachusetts, U.S.A. / 1
TA417.23 .B73 1999 Microstructural characterization of materials / 1
TA417.23 .B73 1999eb Microstructural characterization of materials / 1
TA417.23 .B73 2008 Microstructural characterization of materials / 1
TA417.23 .B73 2008eb Microstructural characterization of materials 1