Call Number (LC) Title Results
TK7871 .A44 Electronic engineering materials and devices. 1
TK7871 .A5 1991 Analysis of microelectronic materials and devices / 1
TK7871 .A53 2010 Global life cycle impact assessments of material shifts the example of a lead-free electronics industry / 1
TK7871 .A62 2010eb 2nd ASEAN--APCTP Workshop on Advanced Materials Science and Nanotechnology 1
TK7871 .A73 2009 Encapsulation technologies for electronic applications /
Encapsulation technologies for electronic applications 		2
TK7871 .B4 Physics of solid state devices,
Physics of solid state devices / 		2
TK7871 .B45 2015eb Utilization of used components : in new electrical and electronic products in accordance with IEC 62309 / 1
TK7871 .B613 1967 Properties of electronic materials / 1
TK7871 .B73 1993 Materials and processing failures in the electronics and computer industry : analysis and prevention / 1
TK7871 .B75 2010 Surfaces and interfaces of electronic materials /
Surfaces and interfaces of electronic materials 		2
TK7871 .B85 2005 Bulk crystal growth of electronic, optical & optoelectronic materials / 1
TK7871 .B85 2005eb Bulk crystal growth of electronic, optical & optoelectronic materials / 1
TK7871 .C47 2006 Chalcogenide alloys for reconfigurable electronics : symposium held April 19-21, 2006, San Francisco, California, U.S.A. / 1
TK7871 .C48 2003 Chemical-mechanical planarization : symposium held April 22-24, 2003, San Francisco, California, U.S.A. / 1
TK7871 .C48 2005 Chemical-mechanical planarization--integration, technology and reliability : symposium held March 28-31, 2005, San Francisco, California, U.S.A. / 1
TK7871 .C67 1992 Corrosion of electronic and magnetic materials / 1
TK7871 .D4 1997 Defects in electronic materials II : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A. / 1
TK7871 .D43 1988 Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A. / 1
TK7871 .D44 2009 Defects in microelectronic materials and devices / 1
TK7871 .D44 2009eb Defects in microelectronic materials and devices 2