Call Number (LC) Title Results
TK7871.85 .X53 2012 Introduction to semiconductor manufacturing technology / 2
TK7871.85.Y33 2003eb Semiconductor Materials : an Introduction to Basic Principles / 1
TK7871.85 .Y36 Fundamentals of semiconductor devices / 1
TK7871.85 .Y65 1991 Microwave semiconductor devices / 1
TK7871.85 .Y66 2008 Semiconductor manufacturing technology /
Semiconductor manufacturing technology 		2
TK7871.85 .Y83 1998 Semiconductor device physics and simulation / 1
TK7871.85 .Y83 1998eb Semiconductor device physics and simulation / 1
TK7871.85 Z356 2011 Bahan Semikonduktor III-Nitrida. 1
TK7871.85 .Z43 2018 Wafer fabrication : automated material handling systems / 1
TK7871.85 .Z8 Electronic circuits for the behavioral and biomedical sciences : a reference book of useful solid-state circuits /
Electronic circuits for the behavioral and biomedical sciences; a reference book of useful solid-state circuits 		2
TK7871.85 ebook Fotoelectroquímica de semiconductores : su aplicación a la conversión y almacenamiento de energía solar / 1
TK7871.85 TK7874 Nasecode IV : proceedings of the Fourth International Conference on the Numerical Analysis of Semiconductor Devices and Integrated Circuits : 19-21 June 1985, Trinity College, Dublin, Ireland /
NASECODE V : proceedings of the Fifth International Conference on the Numerical Analysis of Semiconductor Devices and Integrated Circuits : 17-19 June 1987, Trinity College, Dublin, Ireland / 		2
TK7871.852 Electrical overstress (EOS) : devices, circuits, and systems / 1
TK7871.852 .A47 1997 Failure mechanisms in semiconductor devices / 1
TK7871.852 .C47 2000 Semiconductor device and failue analysis : using photon emission microscopy / 1
TK7871.852 .E98 2007eb Extended Defects in Semiconductors : Electronic Properties, Device Effects and Structures. 1
TK7871.852 .F35 1999 Failure analysis of integrated circuits : tools and techniques / 1
TK7871.852 .G73 2000 Metal impurities in silicon-device fabrication / 1
TK7871.852 .H65 2007 Extended defects in semiconductors : electronic properties, device effects and structures / 1
TK7871.852 .H65 2007eb Extended defects in semiconductors electronic properties, device effects and structures / 1