Call Number (LC) Title Results
TK7871.85 .H93 1998 Hydrogen in semiconductors and metals : symposium held April 13-17, 1998, San Francisco, California, U.S.A. / 1
TK7871.85 .I2 1977 Conference record of the papers presented at the 1977 IEEE/IAS International Semiconductor Power Converter Conference, Lake Buena Vista, Fl., 28-31 March, 1977 / 1
TK7871.85 .I23 IEEE journal of solid-state circuits. 1
TK7871.85 .I26a IEEE/SEMI International Semiconductor Manufacturing Science Symposium : [proceedings]
IEEE International Symposium on Semiconductor Manufacturing conference proceedings.
Proceedings / 		3
TK7871.85 I27 Proceedings / 2
TK7871.85 .I27a Proceedings / 2
TK7871.85 .I293 Proceedings.
Proceedings - IEEE International SOI Conference. 		2
TK7871.85 .I333 IEEE transactions on semiconductor manufacturing : a publication of the IEEE Components, Hybrids, and Manufacturing Technology Society, the IEEE Electron Devices Society, the IEEE Reliability Society, the IEEE Solid-State Circuits Council. 1
TK7871.85 .I46 2010 Semiconductor nanostructures : quantum states and electronic transport / 1
TK7871.85 .I46 2010eb Semiconductor nanostructures : quantum states and electronic transport /
Semiconductor nanostructures quantum states and electronic transport / 		2
TK7871.85 .I48 1981 Impurity doping processes in silicon 1
TK7871.85 .I48 1997 In-line characterization techniques for performance and yield enhancement in microelectronic manufacturing : 1-2 October 1997, Austin, Texas / 1
TK7871.85 .I482 1998 In-line characterization techniques for performance and yield enhancement in microelectronic manufacturing II : 23-24 September, 1998, Santa Clara, California / 1
TK7871.85 .I485 1997 In-line characterization techniques for performance and yield enhancement in microelectronic manufacturing 1-2 October 1997, Austin, Texas / 1
TK7871.85 .I486 1999 In-line methods and monitors for process and yield improvement : 22-23 September 1999, Santa Clara, California /
In-line methods and monitors for process and yield improvement 22-23 September 1999, Santa Clara, California / 		2
TK7871.85 .I54 2003 Interlayer dielectrics for semiconductor technologies / 1
TK7871.85 .I575 1997 Defect recognition and image processing in semiconductors 1997 : proceedings of the 7th International Conference on Defect Recognition and Image Porcessing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997 / 1
TK7871.85 .I575 2011 Defects-recognition imaging and physics in semiconductors XIV : selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan / 1
TK7871.85 .I576 1970 Ion implantation / 1
TK7871.85 .I5762 1974 Ion implantation in semiconductors : science and technology : [proceedings of the fourth International Conference on Ion Implantation in Semiconductors and Other Materials, held at the Osaka Chamber of Commerce and Industry, August 1974] / 1