Call Number (LC) Title Results
TK7871.99.M44 O35 2008eb Smart CMOS image sensors and applications 1
TK7871.99.M44 O35 2019 Smart CMOS image sensors and applications / 2
TK7871.99.M44 O37 1999 High-performance system design : circuits and logic /
High-performance system design circuits and logic / 		2
TK7871.99.M44 O42 1999 Ionizing radiation effects in MOS oxides / 1
TK7871.99.M44 O95 2002eb Oxide reliability : a summary of silicon oxide wearout, breakdown, and reliability / 1
TK7871.99.M44 O95 2009 Oxide and nitride semiconductors processing, properties and applications / 1
TK7871.99.M44 P36 2022 Resistor-based temperature sensors in CMOS technology / 1
TK7871.99.M44 P38 2008 CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test / 1
TK7871.99.M44 P38 2008eb CMOS SRAM circuit design and parametric test in nano-scaled technologies process-aware SRAM design and test / 1
TK7871.99.M44 P56 2006 Low-power CMOS circuits : technology, logic design and CAD tools / 2
TK7871.99.M44 P57 2011 CMOS integrated switching power converters a structured design approach / 1
TK7871.99.M44 P63 2017 Plasma etching for CMOS devices realization / 1
TK7871.99.M44 P69 2010 Power/HVMOS devices compact modeling 1
TK7871.99.M44 R33 1996 Low power design methodologies / 1
TK7871.99.M44 R35 1995 Iddq testing for CMOS VLSI / 1
TK7871.99.M44 R37 2010 Rare-earth implanted MOS devices for silicon photonics microstructural, electrical and optoelectronic properties / 1
TK7871.99.M44 R43 2022 Recent advances in PMOS negative bias temperature instability : characterization and modeling of device architecture, material and process impact / 1
TK7871.99.M44 R455 2009 Reliability wearout mechanisms in advanced CMOS technologies / 1
TK7871.99.M44 R455 2009eb Reliability wearout mechanisms in advanced CMOS technologies 1
TK7871.99.M44 .R56 2014eb Geometric models for rolling-shutter and push-broom sensors / 1