Call Number (LC) | Title | Results |
---|---|---|
TK7878 .H48 | MLA measurement concepts / | 1 |
TK7878 .I18 1973 | 1973 IEEE-G-MTT International Microwave Symposium : University of Colorado, June 4,5,6 : "applications in the 70's." | 1 |
TK7878 .I3295 | Conference record : IEEE Instrumentation and Measurement Conference. | 1 |
TK7878 .I332 1984 | IEEE standard ATLAS test language / | 1 |
TK7878 .I34 1982 | IEEE standard C/ATLAS / | 1 |
TK7878 .I57 1993 | Second International Symposium on Measurement Technology and Intelligent Instruments : 29 October-5 November 1993, Wuhan, China / | 1 |
TK7878 .I58 2011 | Instrumentation, measurement, circuits and systems | 1 |
TK7878 .I584 2008e | Fifth International Symposium on Instrumentation Science and Technology 15-18 September 2008, Shenyang, China / | 1 |
TK7878 .K36 1979 | Electronic measurements / | 1 |
TK7878 .K523 | Precision electronics / | 1 |
TK7878 .K57 2010 | Electronic measurements and instrumentation / | 1 |
TK7878 .L42 | Handbook of practical electronic tests and measurements / | 1 |
TK7878 .M3344 2006 | Digital timing measurements : from scopes and probes to timing and jitter / | 1 |
TK7878 .M335 2006eb | Digital timing measurements from scopes and probes to timing and jitter / | 1 |
TK7878 .M34 1974 | Electronic measurements for scientists / | 1 |
TK7878 .N32 2005 | Synthetic instruments : concepts and applications / | 1 |
TK7878 .N32 2005eb |
Synthetic instruments : concepts and applications / Synthetic instruments concepts and applications / |
2 |
TK7878 .O4 | Electronic measurements and instrumentation / | 2 |
TK7878 .P46 2002 | Photomask and next-generation lithography mask technology IX 23-25 April, 2002, Yokohama, Japan / | 1 |
TK7878 .P46 2003 | Photomask and next-generation lithography mask technology X 16-18 April, 2003, Yokohama, Japan / | 1 |