Search Results - Ajuria, Sergio
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1
In-line methods and monitors for process and yield improvement : 22-23 September 1999, Santa Clara, California /
Published 1999Other Authors: “…Ajuria, Sergio…”
Book
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2
In-line methods and monitors for process and yield improvement 22-23 September 1999, Santa Clara, California /
Published 1999Other Authors: “…Ajuria, Sergio…”
Full Text (via SPIE Digital Library)
Electronic eBook -
3
In-line characterization techniques for performance and yield enhancement in microelectronic manufacturing II 23-24 September, 1998, Santa Clara, California /
Published 1998Other Authors: “…Ajuria, Sergio…”
Full Text (via SPIE Digital Library)
Electronic eBook -
4
In-line characterization techniques for performance and yield enhancement in microelectronic manufacturing : 1-2 October 1997, Austin, Texas /
Published 1997Other Authors: “…Ajuria, Sergio…”
Book -
5
In-line characterization techniques for performance and yield enhancement in microelectronic manufacturing 1-2 October 1997, Austin, Texas /
Published 1997Other Authors: “…Ajuria, Sergio…”
Full Text (via SPIE Digital Library)
Electronic eBook -
6
In-line characterization techniques for performance and yield enhancement in microelectronic manufacturing II : 23-24 September, 1998, Santa Clara, California /
Published 1998Other Authors: “…Ajuria, Sergio…”
Book