Search Results - Christou, A.

  • Showing 1 - 4 results of 4
Refine Results
  1. 1
    Cover Image

    Automated scanning low-energy electron probe (ASLEEP) for semiconductor wafer diagnostics / by Christou, A.

    Published 1978
    Search for the full-text version of this title in HathiTrust
    Government Document Book

    Save to List
    Saved in:
  2. 2
    Cover Image

    Semiconductor Device Reliability / by Christou, A.

    Published 1989
    Full Text (via Springer)
    eBook

    Save to List
    Saved in:
  3. 3
    Cover Image

    Reliability of gallium arsenide MMICs /

    Published 1992
    Other Authors: “…Christou, A.…”
    Book

    Save to List
    Saved in:
  4. 4
    Cover Image

    Electromigration and electronic device degradation /

    Published 1994
    Other Authors: “…Christou, A.…”
    Book

    Save to List
    Saved in:
Search Tools: RSS Feed – Save Search