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The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements by Ehrstein, James R.
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Preparation and certification of SRM's for calibration of spreading resistance probes by Ehrstein, James R.
Published 1985Call Number: Loading…
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3
Standard reference materials : preparation and certification of SRM's for calibration of spreading resistance probes / by Ehrstein, James R.
Published 1985Other Authors: “…Ehrstein, James R.…”
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4
Spreading resistance symposium / by Ehrstein, James R.
Published 1974Other Authors: “…Ehrstein, James R.…”
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5
Some considerations regarding film thickness standards for the semiconductor industry / by Ehrstein, James R.
Published 1980Other Authors: “…Ehrstein, James R.…”
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6
The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements by Ehrstein, James R.
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7
Spreading resistance analysis for silicon layers with nonuniform resistivity / by Dickey, David H.
Published 1979Other Authors: “…Ehrstein, James R.…”
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8
Spreading Resistance Symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974 /
Published 1974Other Authors: “…Ehrstein, James R.…”
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9
Spreading resistance analysis for silicon layers with nonuniform resistivity / by Dickey, David H.
Published 1979Other Authors:Call Number: Loading…Online Access
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