Showing 1 - 5 results of 5 for search 'Jerke, John M.', query time: 0.02s Refine Results
  1. 1
    Semiconductor measurement technology : Optical and dimensional-measurement problems with photomasking in microelectronics /

    Semiconductor measurement technology : Optical and dimensional-measurement problems with photomasking in microelectronics / by Jerke, John M.

    Published 1975
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    Government Document Book
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  2. 2
    Interlaboratory study on linewidth measurements for antireflective chromium photomasks /

    Interlaboratory study on linewidth measurements for antireflective chromium photomasks / by Jerke, John M.

    Published 1982
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    Government Document eBook
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  3. 3
    Accurate linewidth measurements on integrated-circuit photomasks /

    Accurate linewidth measurements on integrated-circuit photomasks / by Jerke, John M.

    Published 1980
    Other Authors: “…Jerke, John M.…”
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  4. 4
    Interlaboratory study on linewidth measurements for antireflective chromium photomasks

    Interlaboratory study on linewidth measurements for antireflective chromium photomasks by Jerke, John M.

    Published 1982
    Government Document Microfilm Book
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  5. 5
    Accurate linewidth measurements on integrated-circuit photomasks /

    Accurate linewidth measurements on integrated-circuit photomasks /

    Published 1980
    Other Authors: “…Jerke, John M.…”
    Search for the full-text version of this title in HathiTrust
    Government Document Book
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    Saved in:
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