Search Results - Raik, Jaan, 1972-

Structural decision diagrams in digital test : theory and applications / by Ubar, Raimund, 1941-, Raik, Jaan, 1972-, Jenihhin, Maksim, Jutman, Artur

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VLSI-SoC : System-on-Chip in the Nanoscale Era - Design, Verification and Reliability : 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 20...

Other Authors: “…Raik, Jaan, 1972-…”
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