Showing 1 - 8 results of 8 for search 'Sawyer, David E.', query time: 0.02s Refine Results
  1. 1
    The Effects of the School for Science and Technology on Other High School Programs Baseline Data and Initial Observations. The Thomas Jefferson High School for Science and Technology Report No. 1 /

    The Effects of the School for Science and Technology on Other High School Programs Baseline Data and Initial Observations. The Thomas Jefferson High School for Science and Technolo... by Sawyer, David E.

    Published 1986
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  2. 2
    The Admissions and Selections Process December 20, 1984-October 1, 1986. The Thomas Jefferson High School for Science and Technology Report No. 2 /

    The Admissions and Selections Process December 20, 1984-October 1, 1986. The Thomas Jefferson High School for Science and Technology Report No. 2 / by Sawyer, David E.

    Published 1986
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  3. 3
    School for Science and Technology An Analysis of the Student Survey /

    School for Science and Technology An Analysis of the Student Survey / by Sawyer, David E.

    Published 1984
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  4. 4
    The First Year Experience Reactions of Faculty, Students, & Parents; Achievements and Awards. The Thomas Jefferson High School for Science and Technology Report No. 3 /

    The First Year Experience Reactions of Faculty, Students, & Parents; Achievements and Awards. The Thomas Jefferson High School for Science and Technology Report No. 3 / by Sawyer, David E.

    Published 1987
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  5. 5
    Laser scanning of active semiconductor devices--videotape script /

    Laser scanning of active semiconductor devices--videotape script / by Sawyer, David E.

    Published 1976
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    Government Document Book
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  6. 6
    A laser scanner for semiconductor devices / Electronic Technology Division.

    A laser scanner for semiconductor devices / Electronic Technology Division. by Sawyer, David E.

    Published 1977
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    Government Document Book
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  7. 7
    Semiconductor measurement technology : Measurement of transistor scattering parameters /

    Semiconductor measurement technology : Measurement of transistor scattering parameters / by Rogers, George J., Sawyer, David E., Jesch, Ramon L.

    Published 1975
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    Government Document Book
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  8. 8
    NBS/DOE Workshop, Stability of (Thin Film) Solar Cells and Materials /

    NBS/DOE Workshop, Stability of (Thin Film) Solar Cells and Materials /

    Published 1979
    Other Authors: “…Sawyer, David E.…”
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    Government Document Conference Proceeding Book
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