Search Results - Schnabel, C. M.

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    Correlation of EBIC and SWBXT imaged defects and epilayer growth pits in 6H-SiC Schottky diodes / by Schnabel, C. M.

    Published 2000
    Online Access
    Online Access
    Government Document eBook

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  2. 2
    Cover Image

    Correlation of EBIC and SWBXT imaged defects and epilayer growth pits in 6H-SiC Schottky diodes

    Published 2000
    Other Authors: “…Schnabel, C. M.…”
    Government Document Microfilm Book

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