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Semiconductor measurement technology, Improved infrared response technique for detecting defects and impurities in germanium and silicon p-i-n diodes / by Sher, Alvin H.
Published 1975Call Number: Loading…Search for the full-text version of this title in HathiTrust
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Government Document Book -
2
Nomographs for use in the fabrication and testing of Ge (Li) detectors / by Sher, Alvin H.
Published 1970Call Number: Loading…Search for the full-text version of this title in HathiTrust
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Government Document Book -
3
Selection and application guide to commercial intrusion alarm systems / by Sher, Alvin H.
Published 1979Call Number: Loading…Search for the full-text version of this title in HathiTrust
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Government Document Book -
4
Microelectronic interconnection bonding with ribbon wire / by Kessler, H. K., Sher, Alvin H.
Published 1973Call Number: Loading…Search for the full-text version of this title in HathiTrust
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Government Document Book
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