Search Results - Zschech, Ehrenfried

Stress-induced phenomena in metallization Eighth International Workshop on Stress-Induced Phenomena in Metallization, Dresden, Germany, 12-14 September 2005 /

Other Authors: “…Zschech, Ehrenfried…”
Full Text (via Scitation)

Stress management for 3D ICs using through silicon vias international workshop on Stress Management for 3D ICs Using Through Silicon Vias, Albany, NY, U.S.A., March 16, 2010, San F...

Other Authors: “…Zschech, Ehrenfried…”
Full Text (via Scitation)
Stress Management For 3D Ics Using Through Silicon Vias: International Workshop On Stress Management For 3D Ics Using Through Silicon Vias -- AIP Conference Proceedings

Stress-induced phenomena in metallization eleventh International Workshop on Stress-Induced Phenomena in Metallization, Bad Schandau, Germany, 12-14 April 2010 /

Other Authors: “…Zschech, Ehrenfried…”
Full Text (via Scitation)

Advanced interconnects for ULSI technology /

Other Authors: “…Zschech, Ehrenfried…”
Full Text (via ProQuest)

Materials for information technology devices, interconnects and packaging /

Other Authors: “…Zschech, Ehrenfried…”
Full Text (via Springer)

Stress-induced phenomena in metallization Ninth international workshop on stress-induced phenomena in metallization : Kyoto, Japan 4-6 April 2007 /

Other Authors: “…Zschech, Ehrenfried…”
Full Text (via Scitation)

Stress-induced phenomena in metallization Tenth International Workshop on Stress-Induced Phenomena in Metallization : Austin, Texas, 5-7 November 2008 /

Other Authors: “…Zschech, Ehrenfried…”
Full Text (via Scitation)

Materials for information technology : devices, interconnects and packaging /

Other Authors: “…Zschech, Ehrenfried…”

Stress-induced phenomena and reliability in 3D microelectronics : Kyoto, Japan, 28-30 May 2012 /

Other Authors: “…Zschech, Ehrenfried…”
Full Text (via Scitation)