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Radiative properties of semiconductors / N.M. Ravindra, Sita Rajyalaxmi Marthi, Asahel Bañobre.

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Bibliographic Details
Online Access: Online Access
Main Authors: Ravindra, N. M. (Nuggehalli M.) (Author), Marthi, Sita Rajyalaxmi (Author), Bañobre, Asahel (Author)
Format: eBook
Language:English
Published: San Rafael [California] (40 Oak Drive, San Rafael, CA, 94903, USA) : Morgan & Claypool Publishers, [2017]
Series:IOP (Series). Release 3.
IOP concise physics.
Subjects:
Semiconductors > Thermal properties.
Electronics & communications engineering.
Table of Contents:
  • Preface
  • Foreword
  • 1. Introduction to radiative properties
  • 1.1. Introduction
  • 1.2. Properties.
  • 2. Optical and thermal properties
  • 2.1. Optical properties.
  • 3. Instrumentation
  • 3.1. Spectral emissometer
  • 3.2. Czochralski crystal puller
  • 3.3. Polarized radiometer
  • 3.4. Rotating polarizer ellipsometer.
  • 4. Silicon
  • 4.1. Influence of coatings on emissivity.
  • 5. Germanium
  • 6. Graphene
  • 7. Silicon carbide
  • 8. Gallium arsenide
  • 9. Gallium nitride
  • 10. Indium antimonide
  • 11. Indium phosphide
  • 12. Cadmium telluride
  • 13. Mercury cadmium telluride
  • 14. Modeling.
  • 15. Applications
  • 15.1. Silicon
  • 15.2. Germanium
  • 15.3. Graphene
  • 15.4. Silicon carbide
  • 15.5. Gallium arsenide
  • 15.6. Gallium nitride
  • 15.7. Indium antimonide
  • 15.8. Indium phosphide
  • 15.9. Cadmium tellurid
  • 15.10. Mercury cadmium telluride.
  • 16. Global infrastructure for emissivity measurements--examples
  • 16.1. NIST
  • 16.2. NPL
  • 16.3. Shimadzu
  • 16.4. NREL.

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