Liquid surfaces and interfaces : synchrotron X-ray methods / Peter S. Pershan, Mark L. Schlossman.
"The availability of synchrotron x-ray sources and the subsequent developments described in this book have led to substantial progress in our understanding of molecular ordering at liquid interfaces. This practical guide enables graduate students and researchers working in physics, chemistry, b...
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| Format: | eBook |
| Language: | English |
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Cambridge :
Cambridge University Press,
2012.
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MARC
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| 100 | 1 | |a Pershan, Peter S., |d 1934- | |
| 245 | 1 | 0 | |a Liquid surfaces and interfaces : |b synchrotron X-ray methods / |c Peter S. Pershan, Mark L. Schlossman. |
| 260 | |a Cambridge : |b Cambridge University Press, |c 2012. | ||
| 300 | |a 1 online resource. | ||
| 336 | |a text |b txt |2 rdacontent. | ||
| 337 | |a computer |b c |2 rdamedia. | ||
| 338 | |a online resource |b cr |2 rdacarrier. | ||
| 347 | |a data file. | ||
| 504 | |a Includes bibliographical references and index. | ||
| 505 | 0 | |a 1. Introduction -- 2. Instrumentation -- 3. Theory of x-ray scattering from liquid surfaces -- 4. Experiments on liquid surfaces and interfaces. | |
| 520 | |a "The availability of synchrotron x-ray sources and the subsequent developments described in this book have led to substantial progress in our understanding of molecular ordering at liquid interfaces. This practical guide enables graduate students and researchers working in physics, chemistry, biology and materials science to understand and carry out experimental investigations into the basic physical and chemical properties of liquid surfaces and interfaces. The book examines the surfaces of bulk liquids, thin wetting films and buried liquid-liquid interfaces. It discusses experiments on simple and complex fluids, including pure water and organic liquids, liquid crystals, liquid metals, electrified liquid-liquid interfaces and interfacial monolayers of amphiphiles, nanoparticles, polymers and biomolecules. A detailed description of the apparatus and techniques required for these experiments is provided, and theoretical approaches to data analysis are described, including approximate methods such as the Master formula, the Born approximation, Parratt's algorithm and the Distorted Wave Approximation"-- |c Provided by publisher. | ||
| 546 | |a English. | ||
| 588 | 0 | |a Print version record. | |
| 650 | 0 | |a Liquid-liquid interfaces. | |
| 650 | 0 | |a Synchrotron radiation. | |
| 650 | 0 | |a X-ray spectroscopy. | |
| 650 | 7 | |a Liquid-liquid interfaces. |2 fast |0 (OCoLC)fst00999667. | |
| 650 | 7 | |a Synchrotron radiation. |2 fast |0 (OCoLC)fst01141097. | |
| 650 | 7 | |a X-ray spectroscopy. |2 fast |0 (OCoLC)fst01181847. | |
| 700 | 1 | |a Schlossman, Mark. | |
| 776 | 0 | 8 | |i Print version: |a Pershan, Peter S., 1934- |t Liquid surfaces and interfaces |z 9780521814010 |w (DLC) 2012021839 |w (OCoLC)779264961. |
| 856 | 4 | 0 | |u https://ebookcentral.proquest.com/lib/ucb/detail.action?docID=977134 |z Full Text (via ProQuest) |
| 880 | 0 | |6 505-00/(S |a Cover -- Liquid Surfaces and Interfaces: Synchrotron X-ray Methods -- Title -- Copyright -- Dedication -- Contents -- Preface -- Tables of widely used symbols -- Greek symbols -- Roman symbols -- Special formatting -- Abbreviations -- 1: Introduction -- 1.1 The intrinsic liquid/vapor interface -- 1.2 Surface-induced order -- 1.2.1 Surface layering -- 1.2.2 In-plane surface order -- 1.3 Capillary waves on the liquid surface -- 1.4 Thin liquid films -- 1.5 Buried interfaces -- 1.6 Optical methods -- 1.6.1 Ellipsometry -- 1.6.2 Non-linear optics -- 1.7 X-ray surface methods -- 1.8 Further reading -- 1.8.1 X-ray physics -- 1.8.2 Capillary wave theory -- 1.8.3 Soft matter -- 1.9 References -- 2: Instrumentation -- 2.1 Introduction -- 2.2 Liquid-surface reflectometers -- 2.3 Kinematics of scattering from liquid surfaces and interfaces -- 2.4 Overview of the first type of liquid-surface scattering instrument -- 2.4.1 Steering crystal: simple tracking -- 2.5 Detailed full alignment -- 2.5.1 Optical prealignment -- 2.5.2 X-ray alignment: first steps -- 2.5.3 Steering-crystal alignment -- Centering the steering-crystal face on the synchrotron beam -- Equations for the miscut and the effect of η ≠ 0 -- Correcting for the miscut -- Correcting for η ≠ 0 -- 2.5.4 Input-arm tracking: equations -- Equations for the incident wave vector when using a bt stage -- 2.5.5 Input-arm, sample-stage, and output-arm alignment -- Preliminary input-arm zero -- Input-arm tracking and setting L1 -- First sample reflection and setting L2 and L3 -- Precise X-ray determination of αi = 0 for a flat sample -- Alignment with curved samples -- Aligning the guard slit S2 and setting the zero of the output-arm rotation -- 2.5.6 The output (detector) arm for grazing-incidence diffraction -- Two-slit arm -- Angular-selection arm -- Area detectors. | |
| 880 | 8 | |6 505-00/(S |a 2.5.7 Reflectometer motions as a function of Q -- Qz dependence for reflectometer with base-tilt (bt) stage -- 2.6 Overview of the second type of liquid-surface scattering instrument -- 2.6.1 Practical issues for the second type of reflectometer -- 2.6.2 First vs. second type of instrument -- 2.7 Detectors -- 2.7.1 Gas-ionization detectors -- 2.7.2 Scintillation detectors -- 2.7.3 Photodiodes -- 2.7.4 Position-sensitive linear detector (PSD-1D) -- 2.7.5 Position-sensitive area detector (PSD-2D) -- 2.8 Absorber calibration -- 2.9 Non-synchrotron-based liquid-surface reflectometers -- 2.9.1 Fixed X-ray sources -- 2.9.2 Butterfly-type reflectometers -- 2.10 Addenda -- 2.10.1 Bragg reflection -- 2.10.2 Alignment without a tilt stage -- Equations for the incident wave vector in the absence of the bt stage -- The Qz dependence for a reflectometer without a bt stage -- 2.11 References -- 3: Theory of X-ray scattering from liquid surfaces -- 3.1 Introduction -- 3.2 Overview of the theory -- 3.3 Reflection from an idealized flat surface: the Fresnel reflectivity -- 3.4 Reflection from less idealized surfaces -- 3.4.1 The Parratt method -- 3.4.2 The master-formula approximation -- 3.5 The Born approximation -- 3.5.1 General development -- 3.6 Examples of applications for flat surfaces -- 3.6.1 The surface structure factor Φeff (Qz) -- 3.6.2 The surface structure factor for layered surfaces -- 3.6.3 The Patterson function -- 3.7 The effect of thermal roughness -- 3.7.1 Resolution effects on the capillary-roughness model -- Diffuse scattering: numerical integration -- Specular reflectivity: numerical integration -- Specular reflectivity: analytic approximation -- Specular reflectivity: circular resolution function -- Diffuse scattering: analytic approximation -- 3.8 The distorted-wave approximation (DWA) -- 3.8.1 Formal development. | |
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