X-ray Ptychography on low dimensional hard condensed matter materials [electronic resource]

Saved in:
Bibliographic Details
Online Access: Online Access (via OSTI)
Corporate Author: Brookhaven National Laboratory (Researcher)
Format: Government Document Electronic eBook
Language:English
Published: Washington, D.C. : Oak Ridge, Tenn. : United States. Department of Energy. Office of Basic Energy Sciences ; distributed by the Office of Scientific and Technical Information, U.S. Department of Energy, 2019.
Subjects:

MARC

LEADER 00000nam a22000003u 4500
001 b10470431
003 CoU
005 20190418224545.9
006 m o d f
007 cr |||||||||||
008 190514e20190311||| o| f0|||||eng|d
035 |a (TOE)ost1494045 
035 |a (TOE)1494045 
040 |a TOE  |c TOE 
049 |a GDWR 
072 7 |a 75  |2 edbsc 
086 0 |a E 1.99:bnl--211254-2019-jaam 
086 0 |a E 1.99:bnl--211254-2019-jaam 
088 |a bnl--211254-2019-jaam 
245 0 0 |a X-ray Ptychography on low dimensional hard condensed matter materials  |h [electronic resource] 
260 |a Washington, D.C. :  |b United States. Department of Energy. Office of Basic Energy Sciences ;  |a Oak Ridge, Tenn. :  |b distributed by the Office of Scientific and Technical Information, U.S. Department of Energy,  |c 2019. 
300 |a Article No. 011306 :  |b digital, PDF file. 
336 |a text  |b txt  |2 rdacontent. 
337 |a computer  |b c  |2 rdamedia. 
338 |a online resource  |b cr  |2 rdacarrier. 
500 |a Published through SciTech Connect. 
500 |a 03/11/2019. 
500 |a "bnl--211254-2019-jaam" 
500 |a Applied Physics Reviews 6 1 ISSN 1931-9401 AM. 
500 |a Xiowen Shi; Ian K. Robinson; Nicolas Burdet; Bo Chen; Gang Xiong; Robert Streubel; Ross Harder. 
520 3 |a Tailoring structural, chemical and electronic (dis-)order in heterogeneous media is one of the transformative opportunities to enable new functionalities and sciences in energy and quantum materials. This endeavor requires elemental, chemical, and magnetic sensitivity at the nano/atomic scale in two-and three-dimensional space. Soft and hard x-ray radiation provided by synchrotron facilities have emerged as standard characterization probes owing to their inherent element-specificity and high intensity. One of the most promising methods in view of sensitivity and spatial resolution is coherent diffraction imaging, namely x-ray ptychography, which is envisioned to take on the dominance of electron imaging techniques offering with atomic resolution in the age of diffraction limited light sources. In this review, we discuss current research examples of far-field diffraction-based x-ray ptychography on two-dimensional and three-dimensional semiconductors, ferroelectrics, and ferromagnets, and its blooming future as a mainstream tool for materials sciences. 
536 |b SC0012704. 
650 7 |a Condensed Matter Physics, Superconductivity And Superfluidity.  |2 edbsc. 
710 2 |a Brookhaven National Laboratory.  |4 res. 
710 1 |a United States.  |b Department of Energy.  |b Office of Basic Energy Sciences.  |4 spn. 
710 1 |a United States.  |b Department of Energy.  |b Office of Scientific and Technical Information.  |4 dst. 
856 4 0 |u http://www.osti.gov/scitech/biblio/1494045  |z Online Access (via OSTI) 
907 |a .b104704317  |b 03-09-23  |c 05-17-19 
998 |a web  |b 05-17-19  |c f  |d m   |e p  |f eng  |g    |h 0  |i 1 
956 |a Information bridge 
999 f f |i 612fff99-fbca-576e-9f7e-3a29a8001858  |s 37073218-2663-56b9-a95c-f81c3dfc696d 
952 f f |p Can circulate  |a University of Colorado Boulder  |b Online  |c Online  |d Online  |e E 1.99:bnl--211254-2019-jaam  |h Superintendent of Documents classification  |i web  |n 1