Multi-slice ptychography with large numerical aperture multilayer Laue lenses [electronic resource]
X-Ray Imaging; Phase Retrieval; X-Ray Optics.
Saved in:
| Online Access: |
Online Access (via OSTI) |
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| Corporate Author: | |
| Format: | Government Document Electronic eBook |
| Language: | English |
| Published: |
Washington, D.C. : Oak Ridge, Tenn. :
United States. Department of Energy. Office of Basic Energy Sciences ; distributed by the Office of Scientific and Technical Information, U.S. Department of Energy,
2018.
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| Subjects: |
| Summary: | X-Ray Imaging; Phase Retrieval; X-Ray Optics. |
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| Abstract: | Here, the highly convergent x-ray beam focused by multilayer Laue lenses with large numerical apertures is used as a three-dimensional (3D) probe to image layered structures with an axial separation larger than the depth of focus. Instead of collecting weakly scattered high-spatial-frequency signals, the depth-resolving power is provided purely by the intense central cone diverged from the focused beam. Using the multi-slice ptychography method combined with the on-the-fly scan scheme, two layers of nanoparticles separated by 10 μm are successfully reconstructed with 8.1 nm lateral resolution and with a dwell time as low as 0.05 s per scan point. This approach obtains high-resolution images with extended depth of field, which paves the way for multi-slice ptychography as a high throughput technique for high-resolution 3D imaging of thick samples. |
| Item Description: | Published through SciTech Connect. 05/09/2018. "bnl--204651-2018-jaam" Optica 5 5 ISSN 2334-2536 AM. Hande Ozturk; Hanfei Yan; Yan He; Mingyuan Ge; Zhihua Dong; Meifeng Lin; Evgeny Nazaretski; Ian K. Robinson; Yong S. Chu; Xiaojing Huang. |
| Physical Description: | p. 601-607 : digital, PDF file. |