Multi-slice ptychography with large numerical aperture multilayer Laue lenses [electronic resource]
X-Ray Imaging; Phase Retrieval; X-Ray Optics.
Saved in:
Online Access: |
Online Access (via OSTI) |
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Corporate Author: | |
Format: | Government Document Electronic eBook |
Language: | English |
Published: |
Washington, D.C. : Oak Ridge, Tenn. :
United States. Department of Energy. Office of Basic Energy Sciences ; distributed by the Office of Scientific and Technical Information, U.S. Department of Energy,
2018.
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Subjects: |
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245 | 0 | 0 | |a Multi-slice ptychography with large numerical aperture multilayer Laue lenses |h [electronic resource] |
260 | |a Washington, D.C. : |b United States. Department of Energy. Office of Basic Energy Sciences ; |a Oak Ridge, Tenn. : |b distributed by the Office of Scientific and Technical Information, U.S. Department of Energy, |c 2018. | ||
300 | |a p. 601-607 : |b digital, PDF file. | ||
336 | |a text |b txt |2 rdacontent. | ||
337 | |a computer |b c |2 rdamedia. | ||
338 | |a online resource |b cr |2 rdacarrier. | ||
500 | |a Published through SciTech Connect. | ||
500 | |a 05/09/2018. | ||
500 | |a "bnl--204651-2018-jaam" | ||
500 | |a Optica 5 5 ISSN 2334-2536 AM. | ||
500 | |a Hande Ozturk; Hanfei Yan; Yan He; Mingyuan Ge; Zhihua Dong; Meifeng Lin; Evgeny Nazaretski; Ian K. Robinson; Yong S. Chu; Xiaojing Huang. | ||
520 | 3 | |a Here, the highly convergent x-ray beam focused by multilayer Laue lenses with large numerical apertures is used as a three-dimensional (3D) probe to image layered structures with an axial separation larger than the depth of focus. Instead of collecting weakly scattered high-spatial-frequency signals, the depth-resolving power is provided purely by the intense central cone diverged from the focused beam. Using the multi-slice ptychography method combined with the on-the-fly scan scheme, two layers of nanoparticles separated by 10 μm are successfully reconstructed with 8.1 nm lateral resolution and with a dwell time as low as 0.05 s per scan point. This approach obtains high-resolution images with extended depth of field, which paves the way for multi-slice ptychography as a high throughput technique for high-resolution 3D imaging of thick samples. | |
520 | 0 | |a X-Ray Imaging; Phase Retrieval; X-Ray Optics. | |
536 | |b SC0012704. | ||
650 | 7 | |a Materials Science. |2 edbsc. | |
710 | 2 | |a Brookhaven National Laboratory. |4 res. | |
710 | 1 | |a United States. |b Department of Energy. |b Office of Basic Energy Sciences. |4 spn. | |
710 | 1 | |a United States. |b Department of Energy. |b Office of Scientific and Technical Information. |4 dst. | |
856 | 4 | 0 | |u http://www.osti.gov/scitech/biblio/1437944 |z Online Access (via OSTI) |
907 | |a .b104725552 |b 03-09-23 |c 05-17-19 | ||
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952 | f | f | |p Can circulate |a University of Colorado Boulder |b Online |c Online |d Online |e E 1.99:bnl--204651-2018-jaam |h Superintendent of Documents classification |i web |n 1 |