Multi-slice ptychography with large numerical aperture multilayer Laue lenses [electronic resource]

X-Ray Imaging; Phase Retrieval; X-Ray Optics.

Saved in:
Bibliographic Details
Online Access: Online Access (via OSTI)
Corporate Author: Brookhaven National Laboratory (Researcher)
Format: Government Document Electronic eBook
Language:English
Published: Washington, D.C. : Oak Ridge, Tenn. : United States. Department of Energy. Office of Basic Energy Sciences ; distributed by the Office of Scientific and Technical Information, U.S. Department of Energy, 2018.
Subjects:

MARC

LEADER 00000nam a22000003u 4500
001 b10472555
003 CoU
005 20180718012727.4
006 m o d f
007 cr |||||||||||
008 190514e20180509||| o| f0|||||eng|d
035 |a (TOE)ost1437944 
035 |a (TOE)1437944 
040 |a TOE  |c TOE 
049 |a GDWR 
072 7 |a 36  |2 edbsc 
086 0 |a E 1.99:bnl--204651-2018-jaam 
086 0 |a E 1.99:bnl--204651-2018-jaam 
088 |a bnl--204651-2018-jaam 
245 0 0 |a Multi-slice ptychography with large numerical aperture multilayer Laue lenses  |h [electronic resource] 
260 |a Washington, D.C. :  |b United States. Department of Energy. Office of Basic Energy Sciences ;  |a Oak Ridge, Tenn. :  |b distributed by the Office of Scientific and Technical Information, U.S. Department of Energy,  |c 2018. 
300 |a p. 601-607 :  |b digital, PDF file. 
336 |a text  |b txt  |2 rdacontent. 
337 |a computer  |b c  |2 rdamedia. 
338 |a online resource  |b cr  |2 rdacarrier. 
500 |a Published through SciTech Connect. 
500 |a 05/09/2018. 
500 |a "bnl--204651-2018-jaam" 
500 |a Optica 5 5 ISSN 2334-2536 AM. 
500 |a Hande Ozturk; Hanfei Yan; Yan He; Mingyuan Ge; Zhihua Dong; Meifeng Lin; Evgeny Nazaretski; Ian K. Robinson; Yong S. Chu; Xiaojing Huang. 
520 3 |a Here, the highly convergent x-ray beam focused by multilayer Laue lenses with large numerical apertures is used as a three-dimensional (3D) probe to image layered structures with an axial separation larger than the depth of focus. Instead of collecting weakly scattered high-spatial-frequency signals, the depth-resolving power is provided purely by the intense central cone diverged from the focused beam. Using the multi-slice ptychography method combined with the on-the-fly scan scheme, two layers of nanoparticles separated by 10 μm are successfully reconstructed with 8.1 nm lateral resolution and with a dwell time as low as 0.05 s per scan point. This approach obtains high-resolution images with extended depth of field, which paves the way for multi-slice ptychography as a high throughput technique for high-resolution 3D imaging of thick samples. 
520 0 |a X-Ray Imaging; Phase Retrieval; X-Ray Optics. 
536 |b SC0012704. 
650 7 |a Materials Science.  |2 edbsc. 
710 2 |a Brookhaven National Laboratory.  |4 res. 
710 1 |a United States.  |b Department of Energy.  |b Office of Basic Energy Sciences.  |4 spn. 
710 1 |a United States.  |b Department of Energy.  |b Office of Scientific and Technical Information.  |4 dst. 
856 4 0 |u http://www.osti.gov/scitech/biblio/1437944  |z Online Access (via OSTI) 
907 |a .b104725552  |b 03-09-23  |c 05-17-19 
998 |a web  |b 05-17-19  |c f  |d m   |e p  |f eng  |g    |h 0  |i 1 
956 |a Information bridge 
999 f f |i e9a8d006-8ee4-5a25-bdfd-b46cb0907c82  |s 0bdebdc5-2c86-5bad-9454-67f22ce60914 
952 f f |p Can circulate  |a University of Colorado Boulder  |b Online  |c Online  |d Online  |e E 1.99:bnl--204651-2018-jaam  |h Superintendent of Documents classification  |i web  |n 1