Mapping local and global variability in plant trait distributions [electronic resource]

Le; Gl; Plant Traits; Bayesian Modeling; Spatial Statistics; Global Climate.

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Bibliographic Details
Online Access: Online Access (via OSTI)
Corporate Author: Oak Ridge National Laboratory (Researcher)
Format: Government Document Electronic eBook
Language:English
Published: Washington, D.C. : Oak Ridge, Tenn. : United States. Department of Energy. Office of Science ; distributed by the Office of Scientific and Technical Information, U.S. Department of Energy, 2017.
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Mapping local and global variability in plant trait distributions

Published 2017
Online Access (via OSTI)
Government Document Electronic eBook