Three-dimensional electron microscopy / edited by Thomas Müller-Reichart, Gaia Pigino.

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Bibliographic Details
Other Authors: Müller-Reichert, Thomas, 1962- (Editor), Pigino, Gaia (Editor)
Format: Book
Language:English
Published: Cambridge, MA, United States : Academic Press, 2019.
Edition:First edition.
Series:Methods in cell biology ; v. 152.
Subjects:
Table of Contents:
  • Chapter 1. FIB-SEM of mouse nervous tissue: Fast and slow sample preparation / Anna M. Steyer, Andreas Schertel, Christos Nardis, Wiebke Möbius
  • Chapter 2. Expedited large-volume 3-D SEM workflows for comparative microanatomical imaging / Gerald John Shami, Delfine Cheng, Filip Braet
  • Chapter 3. Serial-section electron microscopy using automated tape-collecting ultramicrotome (ATUM) / Valentina Baena, Richard Lee Schalek, Jeff William Lichtman, Mark Terasaki
  • Chapter 4. Serial block face-scanning electron microscopy for volume electron microscopy / Saskia Lippens, Anna Kremer, Peter Borghgraef, Christopher J. Guérin
  • Chapter 5. Combining serial block face and focused ion beam scanning electron microscopy for 3D studies of rare events / Christopher J. Guérin, Anna Kremer, Peter Borghgraef, Andy Y. Shih, Saskia Lippens
  • Chapter 6. Yeast membraneless compartments revealed by correlative light microscopy and electron tomography / Guendalina Marini, Gaia Pigino
  • Chapter 7. In situ analysis of male meiosis in C. elegans / Gunar Fabig, Anna Schwarz, Cynthia Striese, Michael Laue, Thomas Müller-Reichert
  • Chapter 8. Software for automated acquisition of electron tomography tilt series / Guenter P. Resch
  • Chapter 9. In situ cryo-electron tomography and subtomogram averaging of intraflagellar transport trains / Mareike A. Jordan, Gaia Pigino
  • Chapter 10. CryoSTEM tomography in biology / Sharon G. Wolf, Michael Elbaum - Chapter 11. Subtomogram averaging from cryo-electron tomograms / Kendra E. Leigh, Paula P. Navarro, Stefano Scaramuzza, Wenbo Chen, Yingi Zhang, Daniel Castaño-Díez, Misha Kudryashev
  • Chapter 12. Computational methods for stitching, alignment, and artifact correction of serial section data / Stephan Saalfeld
  • Chapter 13. Content-aware image restoration for electron microscopy / Tim-Oliver Buchholz, Alexander Krull, Réza Shahidi, Gaia Pigino, Gáspár Jékely, Florian Jug.