Testing and diagnosis of analog circuits and systems / edited by Ruey-wen Liu.

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Bibliographic Details
Online Access: Full Text (via Internet Archive)
Other Authors: Liu, Ruey-Wen
Format: eBook
Language:English
Published: New York, N.Y. : Van Nostrand Reinhold, c1991.
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Description
Physical Description:1 online resource (xiv, 284 pages : illustrations)
Format:Mode of access: Internet.
Bibliography:Includes bibliographical references and index.