Advances in electronics and electron physics. Volume 62 [electronic resource] / edited by Peter W. Hawkes.
ADV ELECTRONICS ELECTRON PHYSICS V62.
Saved in:
| Online Access: |
Full Text (via ScienceDirect) |
|---|---|
| Other Authors: | |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Orlando :
Academic Press,
1984.
|
| Series: | Advances in electronics and electron physics ;
v. 62. |
| Subjects: |
MARC
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| 245 | 0 | 0 | |a Advances in electronics and electron physics. |n Volume 62 |h [electronic resource] / |c edited by Peter W. Hawkes. |
| 260 | |a Orlando : |b Academic Press, |c 1984. | ||
| 300 | |a 1 online resource (x, 304 pages) : |b illustrations. | ||
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| 490 | 1 | |a Advances in electronics and electron physics ; |v v. 62. | |
| 504 | |a Includes bibliographical references and indexes. | ||
| 505 | 0 | |a Front Cover; Advances in Electronics and Electron Physics, Volume 62; Copyright Page; Contents; Contributors to Volume 62; Foreword; Chapter 1. Spin-Polarized Electrons in Solid-state Physics; I. Introduction; II. Experimental Techniques; III. Magnetism in Metals; IV. Magnetism in Systems with Localized Magnetic Moments; V. The Symmetry of Electronic States; VI. The Spin Dependence of the Elastic Scattering of Electrons from Solids; VII. Secondary Electrons; VIII. Surface Magnetochemistry; IX. Surface Magnetization Curves; X. Conclusion; References. | |
| 505 | 8 | |a Chapter 2. Predictions of Deep-Impurity-Level Energies in SemiconductorsI. Introduction; II. What Is a Deep Trap?; III. The Defect Molecule Picture; IV. The Koster-Slater Green's Function Method; V. The Tight-Binding Method; VI. General Theoretical Results; VII. Empirical Trends in Trap-Level Energies of Point Defects; VIII. Empirical Trends in g Factors of Deep Impurities; IX. Predictions; X. Chemical Trends in Transition-Metal Impurities; References; Chapter 3. Recent Advances in the Electron Microscopy of Materials; I. Introduction to Electron Optical Instrumentation. | |
| 505 | 8 | |a II. Advances in InstrumentationIII. Developments in Imaging in the Electron Microscope; IV. Crystallographic Information in the Electron Microscope; V. Chemical Analysis in the Electron Microscope; VI. Combinations of Techniques; VII. Conclusions; References; Auhtor Index; Subject Index. | |
| 520 | |a ADV ELECTRONICS ELECTRON PHYSICS V62. | ||
| 546 | |a English. | ||
| 588 | 0 | |a Print version record. | |
| 650 | 0 | |a Electronics. |0 http://id.loc.gov/authorities/subjects/sh85042383. | |
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| 650 | 7 | |a Electrons. |2 fast |0 (OCoLC)fst00907642. | |
| 700 | 1 | |a Hawkes, P. W. |0 http://id.loc.gov/authorities/names/n79090047 |1 http://isni.org/isni/0000000109005922. | |
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