Electron microscopy and analysis 1997 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, Cavendish Laboratory, University of Cambridge, 2-5 September 1997 / edited by J.M. Rodenburg.
Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge and the fiftieth anniversary of this distinguished Institute group. The book includes papers on the early history of electron microscopy (from P. Hawkes), the deve...
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| Format: | eBook |
| Language: | English |
| Published: |
[Place of publication not identified] :
CRC Press,
2022.
|
| Edition: | First edition. |
| Series: | Institute of Physics conference series ;
no. 153. |
| Subjects: |
MARC
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| 245 | 0 | 0 | |a Electron microscopy and analysis 1997 : |b proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, Cavendish Laboratory, University of Cambridge, 2-5 September 1997 / |c edited by J.M. Rodenburg. |
| 250 | |a First edition. | ||
| 264 | 1 | |a [Place of publication not identified] : |b CRC Press, |c 2022. | |
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| 490 | 1 | |a Institute of Physics conference series ; |v no. 153. | |
| 505 | 0 | |a Plenary lectures (5 papers). New instrumentation and electron optics (15 papers). High resolution electron microscopy (8 papers). Electron crystallography (5 papers). Electron energy-loss spectroscopy (11 papers). Advanced scanning probe techniques (6 papers). Advanced scanning electron microsocpy and surface science (11 papers). Microanalysis (27 papers). Catalysts (7 papers). Semiconductors and superconductors (12 papers). Ceramics and interfaces (19 papers). Intermetallics (11 papers). General materials analysis (23 papers). Index. | |
| 520 | |a Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge and the fiftieth anniversary of this distinguished Institute group. The book includes papers on the early history of electron microscopy (from P. Hawkes), the development of the scanning electron microscope at Cambridge (from K. Smith), electron energy loss spectroscopy (from L.M. Brown), imaging methods (from J. Spence), and the future of electron microscopy (from C. Humphreys). Covering a wide range of applications of advanced techniques, it discusses electron imaging, electron energy-loss and x-ray analysis, and scanning probe and electron beam microscopies. This volume is a handy reference for professionals using microscopes in all areas of physics, materials science, metallurgy, and surface science to gain an overview of developments in our understanding of materials microstructure and of advances in microscope interrogation techniques. | ||
| 545 | 0 | |a John M. Rodenburg. | |
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