Atomic force microscopy [electronic resource] : exploring basic modes and advanced applications / Greg Haugstad.

This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physic...

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Bibliographic Details

Online Access:	Full Text (via Wiley)
Main Author:	Haugstad, Greg, 1963-
Format:	Electronic eBook
Language:	English
Published:	Hoboken, N.J. : John Wiley & Sons, ©2012.
Subjects:	Atomic force microscopy.