Microbiologically influenced corrosion in the upstream oil and gas industry / edited by Dr. Torben Lund Skovhus, Dr. Dennis Enning, Dr. Jason S. Lee.

"Microorganisms are ubiquitously present in petroleum reservoirs and the facilities that produce them. Pipelines, vessels, and other equipment used in upstream oil and gas operations provide a vast and predominantly anoxic environment for microorganisms to thrive. The biggest technical challeng...

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Bibliographic Details
Online Access: Full Text (via Taylor & Francis)
Other Authors: Skovhus, Torben Lund (Editor), Enning, Dennis (Editor), Lee, Jason S. (Editor)
Format: eBook
Language:English
Published: Boca Raton : Taylor & Francis, CRC Press, 2017.
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Summary:"Microorganisms are ubiquitously present in petroleum reservoirs and the facilities that produce them. Pipelines, vessels, and other equipment used in upstream oil and gas operations provide a vast and predominantly anoxic environment for microorganisms to thrive. The biggest technical challenge resulting from microbial activity in these engineered environments is the impact on materials integrity. Oilfield microorganisms can affect materials integrity profoundly through a multitude of elusive (bio)chemical mechanisms, collectively referred to as microbiologically influenced corrosion (MIC). MIC is estimated to account for 20 to 30% of all corrosion-related costs in the oil and gas industry. This book is intended as a comprehensive reference for integrity engineers, production chemists, oilfield microbiologists, and scientists working in the field of petroleum microbiology or corrosion. Exhaustively researched by leaders from both industry and academia, this book discusses the latest technological and scientific advances as well as relevant case studies to convey to readers an understanding of MIC and its effective management."--Provided by publisher.
Physical Description:1 online resource.
Bibliography:Includes bibliographical references and index.
ISBN:9781498726603
1498726607
9781523114009
1523114002
Source of Description, Etc. Note:Print version record.