Talbot-Lau x-ray deflectometer [electronic resource] : Refraction-based HEDP imaging diagnostic.
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| Online Access: |
Full Text (via OSTI) |
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| Format: | Government Document Electronic eBook |
| Language: | English |
| Published: |
Washington, D.C. : Oak Ridge, Tenn. :
United States. National Nuclear Security Administration ; Distributed by the Office of Scientific and Technical Information, U.S. Department of Energy,
2021.
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| Subjects: |
| Abstract: | Talbot-Lau x-ray interferometry has been implemented to map electron density gradients in High Energy Density Physics (HEDP) experiments. X-ray backlighter targets have been evaluated for Talbot-Lau X-ray Deflectometry (TXD). Cu foils, wires, and sphere targets have been irradiated by 10?150 J, 8?30 ps laser pulses, while two pulsed-power generators (̃350 kA, 350 ns and ̃200 kA, 150 ns) have driven Cu wire, hybrid, and laser-cut x-pinches. A plasma ablation front generated by the Omega EP laser was imaged for the first time through TXD for densities >10<sup>23</sup> cm<sup>?3</sup>. Backlighter optimization in combination with x-ray CCD, image plates, and x-ray film has been assessed in terms of spatial resolution and interferometer contrast for accurate plasma characterization through TXD in pulsed-power and high-intensity laser environments. Furthermore, the results obtained thus far demonstrate the potential of TXD as a powerful diagnostic for HEDP. |
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| Item Description: | Published through Scitech Connect. 06/18/2021. "Journal ID: ISSN 0034-6748." "Other: 1171412." Valdivia, M. P. ; Stutman, D. ; Stoeckl, C. ; Theobald, W. ; Collins, IV, G. W. ; Bouffetier, V. ; Vescovi, M. ; Mileham, C. ; Begishev, I. A. ; Klein, S. R. ; et al. Johns Hopkins Univ., Baltimore, MD (United States) Univ. of California San Diego, CA (United States) |
| Physical Description: | Size: Article No. 065110 : digital, PDF file. |