Microelectronic test pattern NBS-4 / W. Robert Thurber and Martin G. Buehler ; Electronic Technology Division, Institute for Applied Technology.
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Search for the full-text version of this title in HathiTrust |
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| Corporate Authors: | , , |
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| Format: | Government Document Book |
| Language: | English |
| Published: |
Washington :
Dept. of Commerce, National Bureau of Standards, Institute for Applied Technology Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,
1978.
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| Series: | Semiconductor measurement technology.
NBS special publication ; 400-32. |
| Subjects: |
MARC
| LEADER | 00000cam a22000001i 4500 | ||
|---|---|---|---|
| 001 | b2176819 | ||
| 003 | CoU | ||
| 005 | 20220204074812.0 | ||
| 008 | 780321s1978 dcua b f000 0 eng | ||
| 010 | |a 78606190 | ||
| 035 | |a (OCoLC)ocm03839014 | ||
| 037 | |a 003-003-01906-2 | ||
| 037 | |b 20402 | ||
| 040 | |a DLC |b eng |c DLC |d GPO |d MvI | ||
| 049 | |a COD9 | ||
| 074 | |a 0247 | ||
| 086 | 0 | |a C 13.10:400-32 | |
| 086 | 0 | |a C 13.10:400-32 | |
| 100 | 1 | |a Thurber, W. Robert. |0 http://id.loc.gov/authorities/names/n78012579 |1 http://isni.org/isni/000000008456302X. | |
| 245 | 1 | 0 | |a Microelectronic test pattern NBS-4 / |c W. Robert Thurber and Martin G. Buehler ; Electronic Technology Division, Institute for Applied Technology. |
| 264 | 1 | |a Washington : |b Dept. of Commerce, National Bureau of Standards, Institute for Applied Technology Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., |c 1978. | |
| 300 | |a 79 pages, 1 unnumbered page : |b illustrations ; |c 26 cm. | ||
| 336 | |a text |b txt |2 rdacontent. | ||
| 337 | |a unmediated |b n |2 rdamedia. | ||
| 338 | |a volume |b nc |2 rdacarrier. | ||
| 490 | 1 | |a Semiconductor measurement technology. | |
| 490 | 1 | |a NBS special publication ; |v 400-32. | |
| 500 | |a Activity was supported by the Defense Advanced Research Projects Agency and the National Bureau of Standards. | ||
| 500 | |a Issued April 1978. | ||
| 500 | |a Prepared by Electronic Technology Division Institute for Applied Technology. | ||
| 504 | |a Includes bibliographical references. | ||
| 650 | 0 | |a Microelectronics. |0 http://id.loc.gov/authorities/subjects/sh85084822. | |
| 650 | 0 | |a Silicon |x Testing. | |
| 700 | 1 | |a Buehler, Martin G. |0 http://id.loc.gov/authorities/names/no2008095481 |1 http://isni.org/isni/0000000384732382. | |
| 710 | 1 | |a United States. |b Defense Advanced Research Projects Agency. |0 http://id.loc.gov/authorities/names/n79004228 |1 http://isni.org/isni/0000000119560321. | |
| 710 | 2 | |a Institute for Applied Technology (U.S.). |b Electronic Technology Division. |0 http://id.loc.gov/authorities/names/n81006250 |1 http://isni.org/isni/0000000103562621. | |
| 710 | 1 | |a United States. |b National Bureau of Standards. |0 http://id.loc.gov/authorities/names/n79021148 |1 http://isni.org/isni/000000012375265X. | |
| 830 | 0 | |a Semiconductor measurement technology. |0 http://id.loc.gov/authorities/names/n42022064. | |
| 830 | 0 | |a NBS special publication ; |v 400-32. |0 http://id.loc.gov/authorities/names/n42017515. | |
| 856 | 4 | 2 | |u https://www.hathitrust.org/ |z Search for the full-text version of this title in HathiTrust |
| 907 | |a .b21768195 |b 01-19-23 |c 09-30-95 | ||
| 998 | |a gov |b 03-21-95 |c - |d m |e - |f eng |g dcu |h 0 |i 2 | ||
| 907 | |a .b21768195 |b 03-07-22 |c 09-30-95 | ||
| 944 | |a MARS - RDA ENRICHED | ||
| 999 | f | f | |i 502cb390-dc60-5e81-9595-0642cd924b47 |s 25ccdf93-e8f8-58f8-8655-72d6f170138b |
| 952 | f | f | |p Can circulate |a University of Colorado Boulder |b Boulder Campus |c Norlin |d Norlin Library - Government Information - US |e C 13.10:400-32 |h Superintendent of Documents classification |i document |m U183046977067 |n 1 |