Microelectronic test pattern NBS-4 / W. Robert Thurber and Martin G. Buehler ; Electronic Technology Division, Institute for Applied Technology.

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Bibliographic Details
Online Access:	Search for the full-text version of this title in HathiTrust
Main Author:	Thurber, W. Robert
Corporate Authors:	United States. Defense Advanced Research Projects Agency, Institute for Applied Technology (U.S.). Electronic Technology Division, United States. National Bureau of Standards
Other Authors:	Buehler, Martin G.
Format:	Government Document Book
Language:	English
Published:	Washington : Dept. of Commerce, National Bureau of Standards, Institute for Applied Technology Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1978.
Series:	Semiconductor measurement technology. NBS special publication ; 400-32.
Subjects:	Microelectronics. Silicon > Testing.

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Holdings details from Norlin Library - Government Information - US
Call Number:	C 13.10:400-32
C 13.10:400-32	Available Place a Hold