Evaluation of Pd-Cr wires for strain gage application [microform] / Jih-Fen Lei, L.C. Greer III and L.G. Oberle.

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Bibliographic Details
Main Author: Lei, Jih-Fen
Corporate Author: United States. National Aeronautics and Space Administration
Other Authors: Greer, Lawrence C., Oberle, L. G.
Format: Government Document Microfilm Book
Language:English
Published: [Washington, DC] : [Springfield, Va.] : National Aeronautics and Space Administration ; [National Technical Information Service, distributor], [1995]
Series:NASA technical memorandum ; 106857.
Subjects:

MARC

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245 1 0 |a Evaluation of Pd-Cr wires for strain gage application  |h [microform] /  |c Jih-Fen Lei, L.C. Greer III and L.G. Oberle. 
260 |a [Washington, DC] :  |b National Aeronautics and Space Administration ;  |a [Springfield, Va.] :  |b [National Technical Information Service, distributor],  |c [1995] 
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490 1 |a NASA technical memorandum ;  |v 106857. 
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533 |a Microfiche.  |b [Washington, D.C. :  |c National Aeronautics and Space Administration,  |d 1995]  |e 1 microfiche. 
650 7 |a Chromium compounds.  |2 nasat. 
650 7 |a Electrical resistance.  |2 nasat. 
650 7 |a Palladium compounds.  |2 nasat. 
650 7 |a Strain gages.  |2 nasat. 
650 7 |a Strain measurement.  |2 nasat. 
650 7 |a Wire.  |2 nasat. 
700 1 |a Greer, Lawrence C. 
700 1 |a Oberle, L. G. 
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