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A simple method of obtaining concentration depth-profiles from X-ray diffraction [microform] / by K.E. Wiedemann, J. Unnam.

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Bibliographic Details
Main Author: Wiedemann, K. E.
Corporate Author: United States. National Aeronautics and Space Administration
Other Authors: Unnam, Jalaiah
Format: Government Document Microfilm Book
Language:English
Published: Warrendale, PA : [Washington, DC] : [Springfield, Va.] : Metallurgical Society of AIME ; [National Aeronautics and Space Administration] ; [National Technical Information Service, distributor], [1984]
Series:NASA contractor report ; NASA CR-176262.
TMS paper selection ; paper no. F84-15.
Subjects:
Convolution integrals.
Depth measurement.
Diffraction patterns.
Luminous intensity.
X ray diffraction.
Description
Item Description:Distributed to depository libraries in microfiche.
Physical Description:1 volume.
Reproduction Note:Microfiche.

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