Assessment of microalloying effects on the high temperature fatigue behavior of NiAl [microform] / R.D. Noebe, B.A. Lerch, and K. Bhanu Sankara Rao.

Saved in:
Bibliographic Details
Main Author: Noebe, R. D.
Corporate Author: United States. National Aeronautics and Space Administration
Other Authors: Lerch, Bradley A., Rao, K. Bhanu Sankara
Format: Government Document Microfilm Book
Language:English
Published: [Washington, D.C.] : [Springfield, Va.] : [National Aeronautics and Space Administration] ; [National Technical Information Service, distributor], [1995]
Series:NASA technical memorandum ; 111213.
Subjects:

Norlin Library - Government Information - Microform

Holdings details from Norlin Library - Government Information - Microform
Call Number: NAS 1.15:111213
NAS 1.15:111213 Restricted Place a Hold