Fabrication, testing, and reliability of semiconductor lasers / sponsored and published by SPIE--The International Society for Optical Engineering.
Saved in:
| Online Access: |
Request a PDF (UCB only) Fabrication, Testing, and Reliability of Semiconductor Lasers -- SPIE Digital Library - Conference Proceedings |
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| Corporate Authors: | , |
| Format: | Serial |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE,
©1996-
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| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 2683. Proceedings of SPIE--the International Society for Optical Engineering ; v. 3004. Proceedings of SPIE--the International Society for Optical Engineering ; v. 3285. |
| Subjects: |
| Published: | [1] (31 Jan.-1 Feb. 1996)- |
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| Physical Description: | volumes : illustrations ; 28 cm. |
| Publication Frequency: | Annual. |
| Numbering Peculiarities Note: | Vol. for 1996 lacks numerican designation, but constitutes 1st conference. |