The influence of modulated signal risetime in flight electronics radiated immunity testing with a mode-stirred chamber [microform] / Jay J. Ely, Truong X. Nguyen, Stephen A. Searce.

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Bibliographic Details
Main Author:	Ely, Jay J.
Corporate Author:	Langley Research Center
Other Authors:	Nguyen, Truong X., Scearce, Stephen A.
Format:	Government Document Microfilm Book
Language:	English
Published:	Hampton, Va. : Hanover, MD : Springfield, VA : National Aeronautics and Space Administration, Langley Research Center ; Available from NASA Center for AeroSpace Information ; National Technical Information Service [distributor], [2000]
Series:	NASA technical memorandum ; 209844.
Subjects:	Field tests. Service life. Field strength. Electromagnetic compatibility.

The influence of modulated signal risetime in flight electronics radiated immunity testing with a mode-stirred chamber / by Ely, Jay J., Nguyen, Truong X., Scearce, Stephen A.

Published 2000

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