Process control and inspection for industry : 8-10 November 2000, Beijing, China / Shulian Zhang, Wei Gao, chairs/editors ; sponsored by COEMA--China Optics & Optoelectronic Manufacturer's Association, CPS--Chinese Physical Society, [and] SPIE--the International Society for Optical Engineering.

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Bibliographic Details
Corporate Authors: China Optics & Optoelectronic Manufacturers Association, Zhongguo wu li xue hui, Society of Photo-Optical Instrumentation Engineers
Other Authors: Zhang, Shulian, Gao, Wei, Ph. D.
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, ©2000.
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4222.
Subjects:

MARC

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