Process control and inspection for industry : 8-10 November 2000, Beijing, China / Shulian Zhang, Wei Gao, chairs/editors ; sponsored by COEMA--China Optics & Optoelectronic Manufacturer's Association, CPS--Chinese Physical Society, [and] SPIE--the International Society for Optical Engineering.
Saved in:
| Corporate Authors: | , , |
|---|---|
| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE,
©2000.
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 4222. |
| Subjects: |
PASCAL Offsite
| Call Number: |
TS156.8 .P74 2000
|
|---|---|
| TS156.8 .P74 2000 | Available Place a Hold |