Statistical analysis with ArcView GIS / Jay Lee, David W.S. Wong.

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Bibliographic Details
Main Author: Lee, Jay
Other Authors: Wong, David W. S.
Format: Book
Language:English
Published: New York : John Wiley, ©2001.
Subjects:
Description
Physical Description:xi, 192 pages : illustrations, maps ; 25 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0471348740 (cloth : alk. paper)