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|a GWRE
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|a TS156.8
|b .P748 1998
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| 245 |
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|a Process control and sensors for manufacturing
|h [electronic resource] :
|b 31 March-1 April 1998, San Antonio, Texas /
|c Richard H. Bossi, David M. Pepper, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, NIST--National Institute of Standards and Technology [and others]
|
| 260 |
|
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|a Bellingham, Wash., USA :
|b SPIE,
|c ©1998.
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| 300 |
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|a vii, 250 pages :
|b illustrations ;
|c 28 cm.
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| 336 |
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|a text
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|2 rdacontent.
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| 337 |
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|a computer
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|v v. 3399.
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| 504 |
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|a Includes bibliographical references and index.
|
| 650 |
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0 |
|a Process control
|x Automation
|v Congresses.
|0 http://id.loc.gov/authorities/subjects/sh2010108527.
|
| 650 |
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0 |
|a Detectors
|x Industrial applications
|v Congresses.
|0 http://id.loc.gov/authorities/subjects/sh2009123259.
|
| 650 |
|
0 |
|a Quality control
|v Congresses.
|0 http://id.loc.gov/authorities/subjects/sh2008110285.
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| 650 |
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|a Detectors
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|2 fast
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|a Process control
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|2 fast
|0 (OCoLC)fst01078021.
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| 650 |
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|a Quality control.
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|a Proceedings of SPIE--the International Society for Optical Engineering ;
|v v. 3399.
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