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|a TA418.9.N35
|b O388 2000
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| 245 |
0 |
0 |
|a Optical devices and diagnostics in materials science
|h [electronic resource] :
|b 1-4 August 2000, San Diego, USA /
|c David L. Andrews [and others] ; sponsored ... by SPIE--the International Society for Optical Engineering.
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| 260 |
|
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|a Bellingham, Wash., USA :
|b SPIE,
|c ©2000.
|
| 300 |
|
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|a viii, 314 pages :
|b illustrations ;
|c 28 cm.
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| 336 |
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|a text
|b txt
|2 rdacontent.
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| 337 |
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|a computer
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|a SPIE proceedings series ;
|v v. 4098.
|
| 504 |
|
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|a Includes bibliographical references and index.
|
| 650 |
|
0 |
|a Nanostructured materials
|x Testing
|v Congresses.
|
| 650 |
|
0 |
|a Optical materials
|x Testing
|v Congresses.
|
| 650 |
|
0 |
|a Optoelectronic devices
|v Congresses.
|0 http://id.loc.gov/authorities/subjects/sh2008108666.
|
| 650 |
|
0 |
|a Light
|x Scattering
|v Congresses.
|0 http://id.loc.gov/authorities/subjects/sh2009129810.
|
| 650 |
|
0 |
|a Near-field microscopy
|x Industrial applications
|v Congresses.
|
| 650 |
|
0 |
|a Raman spectroscopy
|x Industrial applications
|v Congresses.
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| 700 |
1 |
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|a Andrews, David L.
|0 http://id.loc.gov/authorities/names/nb2005003564.
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2 |
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|a Society of Photo-Optical Instrumentation Engineers.
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|1 http://isni.org/isni/0000000122965856.
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|a SPIE Digital Library.
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0 |
|a Proceedings of SPIE--the International Society for Optical Engineering ;
|v v. 4098.
|0 http://id.loc.gov/authorities/names/n42030541.
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