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|a TA417.5
|b .O68 2000
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|a Optical diagnostic methods for inorganic materials II
|h [electronic resource] :
|b 3-4 August 2000, San Diego, USA /
|c Leonard M. Hanssen, chair/editor ; sponsored ... by SPIE--the International Society for Optical Engineering.
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| 260 |
|
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|a Bellingham, Wash., USA :
|b SPIE,
|c ©2000.
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| 300 |
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|a ix, 188 pages :
|b illustrations ;
|c 28 cm.
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| 336 |
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|a text
|b txt
|2 rdacontent.
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| 337 |
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|a computer
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|2 rdamedia.
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| 338 |
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|a online resource
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|a SPIE proceedings series ;
|v v. 4103.
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| 504 |
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|a Includes bibliographical references and index.
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| 650 |
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|a Materials
|x Testing
|v Congresses.
|0 http://id.loc.gov/authorities/subjects/sh2008107543.
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| 650 |
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|a Materials
|x Optical properties
|v Congresses.
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| 650 |
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|a Optical measurements
|v Congresses.
|0 http://id.loc.gov/authorities/subjects/sh2008108676.
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| 650 |
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|a Reflectance
|v Congresses.
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|a Materials
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|a Materials
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|a Optical measurements.
|2 fast
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| 650 |
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|a Reflectance.
|2 fast
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|a Hanssen, Leonard Matheus,
|d 1953-
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|a Society of Photo-Optical Instrumentation Engineers.
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|1 http://isni.org/isni/0000000122965856.
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|a SPIE Digital Library.
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|z Full Text (via SPIE Digital Library)
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| 830 |
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|a Proceedings of SPIE--the International Society for Optical Engineering ;
|v v. 4103.
|0 http://id.loc.gov/authorities/names/n42030541.
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