Optical diagnostics [electronic resource] : 3-4 August 2005, San Diego, California, USA / Leonard M. Hanssen, Patrick V. Farrell, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

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Bibliographic Details
Online Access:	Full Text (via SPIE Digital Library)
Corporate Authors:	Society of Photo-Optical Instrumentation Engineers, SPIE Digital Library
Other Authors:	Farrell, Patrick V., Hanssen, Leonard Matheus, 1953-
Format:	Electronic eBook
Language:	English
Published:	Bellingham, Wash. : SPIE, ©2005.
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 5880.
Subjects:	Materials > Testing > Congresses. Materials > Optical properties > Congresses. Optical measurements > Congresses. Reflectance > Congresses. Refractive index > Congresses. Materials > Optical properties. Materials > Testing. Optical measurements. Reflectance. Refractive index. Conference papers and proceedings.

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Holdings details from Online
Call Number:	TA418.7 .O667 2005
TA418.7 .O667 2005	Available