Machine vision applications in industrial inspection XIII [electronic resource] : 17-18 January 2005, San Jose, California, USA / Jeffery R. Price, Fabrice Meriaudeau, chairs/editors ; sponsored and published by IS & T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.

Saved in:

Bibliographic Details
Online Access:	Full Text (via SPIE Digital Library)
Corporate Authors:	IS & T--the Society for Imaging Science and Technology, Society of Photo-Optical Instrumentation Engineers
Other Authors:	Price, Jeffery R. (Jeffery Ray), 1970- (Editor), Meriaudeau, Fabrice (Editor)
Format:	Electronic eBook
Language:	English
Published:	Bellingham, Wash. : SPIE, ©2005.
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 5679.
Subjects:	Engineering inspection > Automation > Congresses. Computer vision > Industrial applications > Congresses. Quality control > Optical methods > Automation > Congresses. Measurement > Congresses. Engineering inspection > Automation. Computer vision > Industrial applications. Quality control > Optical methods > Automation. Measurement. Conference papers and proceedings.

Internet

Holdings details from Online
Call Number:	TS156.2 .M3275 2005
TS156.2 .M3275 2005	Available